品牌 | 昊量光電 | 供貨周期 | 現貨 |
---|---|---|---|
應用領域 | 綜合 |
Micro-LED晶圓臺各種測試模式
漸漸Mini-LED晶圓臺檢驗平臺和Micro-LED 晶圓臺檢驗平臺(通稱M-LED)尺?的?幅縮?,光通量的驟降,監測難度很大在不斷地攀升,監測總數也在?幅延長,對其一體化管理光電材料特點的監測也談到了更好不斷更新的規定要求。然而,Aunion Tech面世了新一代設計規劃的?主該品牌晶圓級I-V-L-S一體化管理光電材料特點測量臺整體。 Micro-LED 晶圓臺測量整體可能?持蕞?10um尺?的Micro-LED的開啟測量;可能?持男士正裝或倒裝M-LED的各(ge)(ge)(ge)種(zhong)(zhong)試(shi)(shi)(shi)(shi)驗(yan)(yan)各(ge)(ge)(ge)種(zhong)(zhong)試(shi)(shi)(shi)(shi)驗(yan)(yan);不(bu)禁能(neng)(neng)對(dui)單 顆M-LED進(jin)?I-V-L(交流電(dian)壓電(dian)流-交流電(dian)壓-色彩飽(bao)和度)的曲(qu)線的各(ge)(ge)(ge)種(zhong)(zhong)試(shi)(shi)(shi)(shi)驗(yan)(yan)各(ge)(ge)(ge)種(zhong)(zhong)試(shi)(shi)(shi)(shi)驗(yan)(yan),還能(neng)(neng)刷(shua)出?度、主波(bo)?DWL和光(guang)譜圖(tu)信(xin)息;不(bu)禁能(neng)(neng)觀(guan)看單顆LED?身的色彩飽(bao)和度、?度分散區(qu),還能(neng)(neng)改變對(dui)陣列M-LED的色彩飽(bao)和度、?度、波(bo)?不(bu)規則性分散區(qu)進(jin)?測(ce)量和介紹。 Micro-LED 晶圓(yuan)臺各(ge)(ge)(ge)種(zhong)(zhong)試(shi)(shi)(shi)(shi)驗(yan)(yan)各(ge)(ge)(ge)種(zhong)(zhong)試(shi)(shi)(shi)(shi)驗(yan)(yan)操作(zuo)系統改變了對(dui)M-LED的綜合評估(gu)光(guang)電(dian)子效(xiao)果(guo)各(ge)(ge)(ge)種(zhong)(zhong)試(shi)(shi)(shi)(shi)驗(yan)(yan)各(ge)(ge)(ge)種(zhong)(zhong)試(shi)(shi)(shi)(shi)驗(yan)(yan),是(shi)Micro-LED/Mini-LED品牌生產研發、實驗(yan)(yan)性的查(cha)重機(ji)器設備。
M-LED的I-V-L-S整體光電子性能方面測試軟件臺
• 顯微成相+探頭開(kai)啟控(kong)制器:蕞??持10um尺?Micro-LED車輛(liang)
• 超(chao)?分度(du)值的一體化光電產品能檢(jian)驗
- I-V-L-S測式智能(neng)家居控制輸出功(gong)率電流、輸出功(gong)率、色彩飽和度(du)、?度(du)、主波?、光(guang)譜分析等多種不同內容
- 可?持(chi)0.0001-1010 cd/m2 超?測量范圍,完善(shan)測試英文M-LED的特點
- ?持100pA到(dao)1A的超?分度(du)值(zhi)測式(shi)
• 緊密(mi)運?掌握臺
• 隔振光學玻璃app平臺
Micro-LED晶圓臺測試系統技術規格: